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Author

  • Chris H. Kim
2013

An array-based circuit for characterizing latent Plasma-Induced Damage

Choi, W. H., Jain, P. & Kim, C. H., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6532005. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations
2011

A 700MHz 2T1C embedded DRAM macro in a generic logic process with no boosted supplies

Chun, K. C., Zhang, W., Jain, P. & Kim, C. H., May 12 2011, 2011 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, ISSCC 2011. p. 506-507 2 p. 5746418

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations
2015

Overstress-free 4 × VDD switch in a generic logic process supporting high and low voltage modes

Song, S. H., Kim, J. & Kim, C. H., Dec 2015, In : Journal of Semiconductor Technology and Science. 15, 6, p. 664-670 7 p.

Research output: Contribution to journalArticle

2013

Duty-cycle shift under asymmetric BTI aging: A simple characterization method and its application to SRAM timing

Wang, X., Keane, J., Jain, P., Reddy, V. & Kim, C. H., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6532007. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations
2011

An array-based test circuit for fully automated gate dielectric breakdown characterization

Keane, J., Venkatraman, S., Butzen, P. & Kim, C. H., May 1 2011, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 19, 5, p. 787-795 9 p., 5418862.

Research output: Contribution to journalArticle

5 Scopus citations
2017

A Circuit-Based Approach for Characterizing High Frequency Electromigration Effects

Zhou, C., Wang, X., Fung, R., Wen, S. J., Wong, R. & Kim, C. H., Dec 2017, In : IEEE Transactions on Device and Materials Reliability. 17, 4, p. 763-772 10 p., 8103067.

Research output: Contribution to journalArticle

2 Scopus citations

Characterizing the Impact of RTN on Logic and SRAM Operation Using a Dual Ring Oscillator Array Circuit

Tang, Q. & Kim, C. H., Jun 2017, In : IEEE Journal of Solid-State Circuits. 52, 6, p. 1655-1663 9 p., 7892967.

Research output: Contribution to journalArticle

5 Scopus citations
2016

A 0.2-to-1.45GHz subsampling fractional-N all-digital MDLL with zero-offset aperture PD-based spur cancellation and in-situ timing mismatch detection

Kundu, S., Kim, B. & Kim, C. H., Feb 23 2016, 2016 IEEE International Solid-State Circuits Conference, ISSCC 2016. Institute of Electrical and Electronics Engineers Inc., p. 326-327 2 p. 7418039. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 59).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations
2020

Electromigration Effects in Power Grids Characterized from a 65 nm Test Chip

Zhou, C., Fung, R., Wen, S. J., Wong, R. & Kim, C. H., Mar 2020, In : IEEE Transactions on Device and Materials Reliability. 20, 1, p. 74-83 10 p., 8915815.

Research output: Contribution to journalArticle

2016
2013

Program/erase speed, endurance, retention, and disturbance characteristics of single-poly embedded flash cells

Song, S. H., Kim, J. & Kim, C. H., Aug 7 2013, 2013 IEEE International Reliability Physics Symposium, IRPS 2013. 6532095. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
2019

Demonstration of a passive IC tamper sensor based on an exposed floating gate device in a standard logic process

Liu, M. & Kim, C. H., Jun 2019, In : IEEE Transactions on Electron Devices. 66, 6, p. 2735-2740 6 p., 8715737.

Research output: Contribution to journalArticle

2017

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Kumar, S., Cho, M., Everson, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H., Jul 31 2017, 2017 Symposium on VLSI Technology, VLSI Technology 2017. Institute of Electrical and Electronics Engineers Inc., p. C114-C115 7998134. (Digest of Technical Papers - Symposium on VLSI Technology).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2018

A fully integrated 40pF output capacitor beat-frequency-quantizer-based digital LDO with built-in adaptive sampling and active voltage positioning

Kundu, S., Liu, M., Wong, R., Wen, S. J. & Kim, C. H., Mar 8 2018, 2018 IEEE International Solid-State Circuits Conference, ISSCC 2018. Institute of Electrical and Electronics Engineers Inc., p. 308-310 3 p. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 61).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations
2014

Silicon odometers: Compact in situ aging sensors for robust system design

Wang, X., Keane, J., Kim, T. T. H., Jain, P., Tang, Q. & Kim, C. H., Nov 1 2014, In : IEEE Micro. 34, 6, p. 74-85 12 p., 6728928.

Research output: Contribution to journalReview article

16 Scopus citations
2020
2014

Improving STT-MRAM density through multibit error correction

Del Bel, B., Kim, J., Kim, C. H. & Sapatnekar, S. S., 2014, Proceedings - Design, Automation and Test in Europe, DATE 2014. Institute of Electrical and Electronics Engineers Inc., 6800396. (Proceedings -Design, Automation and Test in Europe, DATE).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

38 Scopus citations
2020

A 32Gb/s Digital-Intensive Single-Ended PAM-4 Transceiver for High-Speed Memory Interfaces Featuring a 2-Tap Time-Based Decision Feedback Equalizer and an In-Situ Channel-Loss Monitor

Chiu, P. W. & Kim, C., Feb 2020, 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020. Institute of Electrical and Electronics Engineers Inc., p. 336-338 3 p. 9063137. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2020-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2015

A 8-14 GHz varactorless current controlled LC oscillator in 16nm CMOS technology

Kundu, S., Kireev, V. & Kim, C. H., Sep 28 2015, IEEE 58th International Midwest Symposium on Circuits and Systems: Climbing to New Heights, MWSCAS 2015 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 7282096. (Midwest Symposium on Circuits and Systems; vol. 2015-September).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2013

Subnanowatt carbon nanotube complementary logic enabled by threshold voltage control

Geier, M. L., Prabhumirashi, P. L., McMorrow, J. J., Xu, W., Seo, J. W. T., Everaerts, K., Kim, C. H., Marks, T. J. & Hersam, M. C., Oct 18 2013, In : Nano letters. 13, 10, p. 4810-4814 5 p.

Research output: Contribution to journalArticle

72 Scopus citations
2015

A 0.4-1.6GHz spur-free bang-bang digital PLL in 65nm with a D-flip-flop based frequency subtractor circuit

Kim, B., Kundu, S. & Kim, C. H., Aug 31 2015, 2015 Symposium on VLSI Circuits, VLSI Circuits 2015. Institute of Electrical and Electronics Engineers Inc., p. C140-C141 7231355. (IEEE Symposium on VLSI Circuits, Digest of Technical Papers; vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
2013

A write-back-free 2T1D embedded DRAM with local voltage sensing and a dual-row-access low power mode

Zhang, W., Chun, K. C. & Kim, C. H., Jun 6 2013, In : IEEE Transactions on Circuits and Systems I: Regular Papers. 60, 8, p. 2030-2038 9 p., 6522141.

Research output: Contribution to journalArticle

11 Scopus citations
2017

A compact high-sensitivity 2-Transistor radiation sensor array

Tang, Q., Kumar, S., Kim, C. H. & Fulkerson, D. E., May 30 2017, 2017 International Reliability Physics Symposium, IRPS 2017. Institute of Electrical and Electronics Engineers Inc., p. SE7.1-SE7.4 7936408. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2020

Reliability Characterization of Logic-Compatible NAND Flash Memory based Synapses with 3-bit per Cell Weights and 1μA Current Steps

Kim, M., Song, J. & Kim, C. H., Apr 2020, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9129148. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2015

Spin-Hall effect MRAM based cache memory: A feasibility study

Kim, J., Tuohy, B., Ma, C., Choi, W. H., Ahmed, I., Lilja, D. & Kim, C. H., Aug 3 2015, 73rd Annual Device Research Conference, DRC 2015. Institute of Electrical and Electronics Engineers Inc., p. 117-118 2 p. 7175583. (Device Research Conference - Conference Digest, DRC; vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations
2014

Estimation of instantaneous frequency fluctuation in a fast DVFS environment using an empirical BTI stress-relaxation model

Zhou, C., Wang, X., Xu, W., Zhu, Y., Reddi, V. J. & Kim, C. H., Jan 1 2014, 2014 IEEE International Reliability Physics Symposium, IRPS 2014. Institute of Electrical and Electronics Engineers Inc., p. 2D.2.1-2D.2.6 6860593. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations
2019

An Energy-Efficient One-Shot Time-Based Neural Network Accelerator Employing Dynamic Threshold Error Correction in 65 nm

Everson, L. R., Liu, M., Pande, N. & Kim, C. H., Oct 2019, In : IEEE Journal of Solid-State Circuits. 54, 10, p. 2777-2785 9 p., 8718342.

Research output: Contribution to journalArticle

3 Scopus citations
2015

A Magnetic Tunnel Junction based True Random Number Generator with conditional perturb and real-time output probability tracking

Choi, W. H., Lv, Y., Kim, J., Deshpande, A., Kang, G., Wang, J. P. & Kim, C. H., Feb 20 2015, 2014 IEEE International Electron Devices Meeting, IEDM 2014. February ed. Institute of Electrical and Electronics Engineers Inc., p. 12.5.1-12.5.4 7047039. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2015-February, no. February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

38 Scopus citations

Large-area, low-voltage, antiambipolar heterojunctions from solution-processed semiconductors

Jariwala, D., Sangwan, V. K., Seo, J. W. T., Xu, W., Smith, J., Kim, C. H., Lauhon, L. J., Marks, T. J. & Hersam, M. C., Jan 14 2015, In : Nano letters. 15, 1, p. 416-421 6 p.

Research output: Contribution to journalArticle

54 Scopus citations
2013

Deep trench capacitor based step-up and step-down DC/DC converters in 32nm SOI with opportunistic current borrowing and fast DVFS capabilities

Paul, A., Jiao, D., Sapatnekar, S. S. & Kim, C. H., Dec 1 2013, Proceedings of the 2013 IEEE Asian Solid-State Circuits Conference, A-SSCC 2013. p. 49-52 4 p. 6690979. (Proceedings of the 2013 IEEE Asian Solid-State Circuits Conference, A-SSCC 2013).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations
2011

A 1V printed organic DRAM cell based on ion-gel gated transistors with a sub-10nW-per-cell refresh power

Zhang, W., Ha, M., Braga, D., Renn, M. J., Frisbie, C. D. & Kim, C. H., May 12 2011, 2011 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, ISSCC 2011. p. 326-327 2 p. 5746339

Research output: Chapter in Book/Report/Conference proceedingConference contribution

16 Scopus citations
2016

Soft Response Generation and Thresholding Strategies for Linear and Feed-Forward MUX PUFs

Zhou, C., Satapathy, S., Lao, Y., Parhi, K. K. & Kim, C. H., Aug 8 2016, ISLPED 2016 - Proceedings of the 2016 International Symposium on Low Power Electronics and Design. Institute of Electrical and Electronics Engineers Inc., p. 124-129 6 p. (Proceedings of the International Symposium on Low Power Electronics and Design).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

14 Scopus citations

Estimating delay differences of arbiter PUFs using silicon data

Avvaru, S. V. S., Zhou, C., Satapathy, S., Lao, Y., Kim, C. H. & Parhi, K. K., Apr 25 2016, Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016. Institute of Electrical and Electronics Engineers Inc., p. 543-546 4 p. 7459370. (Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations
2018

Effect of aging on linear and nonlinear MUX PUFs by statistical modeling

Koyily, A., Avvaru, S. V. S., Zhou, C., Kim, C. H. & Parhi, K. K., Feb 20 2018, ASP-DAC 2018 - 23rd Asia and South Pacific Design Automation Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 76-83 8 p. (Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC; vol. 2018-January).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Functional encryption of integrated circuits by key-based hybrid obfuscation

Koteshwara, S., Kim, C. H. & Parhi, K. K., Apr 10 2018, Conference Record of 51st Asilomar Conference on Signals, Systems and Computers, ACSSC 2017. Matthews, M. B. (ed.). Institute of Electrical and Electronics Engineers Inc., p. 484-488 5 p. 8335386. (Conference Record of 51st Asilomar Conference on Signals, Systems and Computers, ACSSC 2017; vol. 2017-October).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2015

Wettability Contrast Gravure Printing

Zhang, H., Ramm, A., Lim, S., Xie, W., Ahn, B. Y., Xu, W., Mahajan, A., Suszynski, W. J., Kim, C., Lewis, J. A., Frisbie, C. D. & Francis, L. F., Dec 2 2015, In : Advanced Materials. 27, 45, p. 7420-7425 6 p.

Research output: Contribution to journalArticle

14 Scopus citations
2017

Solution-processed carbon nanotube true random number generator

Gaviria Rojas, W. A., McMorrow, J. J., Geier, M. L., Tang, Q., Kim, C. H., Marks, T. J. & Hersam, M. C., Aug 9 2017, In : Nano letters. 17, 8, p. 4976-4981 6 p.

Research output: Contribution to journalArticle

18 Scopus citations
2015

Spin-based computing: Device concepts, current status, and a case study on a high-performance microprocessor

Kim, J., Paul, A., Crowell, P. A., Koester, S. J., Sapatnekar, S. S., Wang, J. P. & Kim, C. H., Jan 1 2015, In : Proceedings of the IEEE. 103, 1, p. 106-130 25 p., 6967696.

Research output: Contribution to journalArticle

86 Scopus citations
2017

A scalable time-based integrate-and-fire neuromorphic core with brain-inspired leak and local lateral inhibition capabilities

Liu, M., Everson, L. R. & Kim, C. H., Jul 26 2017, 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., 7993627. (Proceedings of the Custom Integrated Circuits Conference; vol. 2017-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function

Liu, M., Zhou, C., Tang, Q., Parhi, K. K. & Kim, C. H., Aug 11 2017, ISLPED 2017 - IEEE/ACM International Symposium on Low Power Electronics and Design. Institute of Electrical and Electronics Engineers Inc., 8009192. (Proceedings of the International Symposium on Low Power Electronics and Design).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations
2018
Open Access
13 Scopus citations

A Physical Unclonable Function based on Capacitor Mismatch in a Charge-Redistribution SAR-ADC

Tang, Q., Choi, W. H., Everson, L., Parhi, K. K. & Kim, C. H., Apr 26 2018, 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8351601. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 2018-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2017

A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication

Tang, Q., Zhou, C., Choi, W., Kang, G., Park, J., Parhi, K. K. & Kim, C. H., Jul 26 2017, 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., 7993610. (Proceedings of the Custom Integrated Circuits Conference; vol. 2017-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations
2015

The dependence of BTI and HCI-induced frequency degradation on interconnect length and its circuit level implications

Wang, X., Tang, Q., Jain, P., Jiao, D. & Kim, C. H., Feb 1 2015, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 23, 2, p. 280-291 12 p.

Research output: Contribution to journalArticle

3 Scopus citations
2017

Advanced spintronic memory and logic for non-volatile processors

Perricone, R., Ahmed, I., Liang, Z., Mankalale, M. G., Hu, X. S., Kim, C. H., Niemier, M., Sapatnekar, S. S. & Wang, J., May 11 2017, Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017. Institute of Electrical and Electronics Engineers Inc., p. 972-977 6 p. 7927132. (Proceedings of the 2017 Design, Automation and Test in Europe, DATE 2017).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

15 Scopus citations
2019

Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle

Pande, N., Zhou, C., Lin, M. H., Fung, R., Wong, R., Wen, S. & Kim, C. H., Dec 2019, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993548. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2019-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2016

System-Level Power Analysis of a Multicore Multipower Domain Processor with ON-Chip Voltage Regulators

Paul, A., Park, S. P., Somasekhar, D., Kim, Y. M., Borkar, N., Karpuzcu, U. R. & Kim, C. H., Dec 2016, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24, 12, p. 3468-3476 9 p., 7468580.

Research output: Contribution to journalArticle

6 Scopus citations
2011

A programmable adaptive phase-shifting PLL for clock data compensation under resonant supply noise

Jiao, D. & Kim, C. H., May 12 2011, 2011 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, ISSCC 2011. p. 272-273 2 p. 5746315. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations
2015

A comprehensive study on interface perpendicular MTJ variability

Choi, W. H., Kim, J., Ahmed, I. & Kim, C. H., Aug 3 2015, 73rd Annual Device Research Conference, DRC 2015. Institute of Electrical and Electronics Engineers Inc., p. 89-90 2 p. 7175569. (Device Research Conference - Conference Digest, DRC; vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Assessing the impact of RTN on logic timing margin using a 32nm dual ring oscillator array

Tang, Q. & Kim, C. H., Feb 16 2015, 2015 IEEE International Electron Devices Meeting, IEDM 2015. Institute of Electrical and Electronics Engineers Inc., p. 20.7.1-20.7.4 7409745. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2016-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations