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  • Chris H. Kim
2019

Characterizing Electromigration Effects in a 16nm FinFET Process Using a Circuit Based Test Vehicle

Pande, N., Zhou, C., Lin, M. H., Fung, R., Wong, R., Wen, S. & Kim, C. H., Dec 2019, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993548. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2019-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2012

On-chip silicon odometers and their potential use in medical electronics

Keane, J. & Kim, C. H., Sep 28 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. p. 4C.1.1-4C.1.8 6241835. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2016

System-Level Power Analysis of a Multicore Multipower Domain Processor with ON-Chip Voltage Regulators

Paul, A., Park, S. P., Somasekhar, D., Kim, Y. M., Borkar, N., Karpuzcu, U. R. & Kim, C. H., Dec 2016, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 24, 12, p. 3468-3476 9 p., 7468580.

Research output: Contribution to journalArticle

6 Scopus citations
2011

A programmable adaptive phase-shifting PLL for clock data compensation under resonant supply noise

Jiao, D. & Kim, C. H., May 12 2011, 2011 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, ISSCC 2011. p. 272-273 2 p. 5746315. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Scopus citations
2015

A comprehensive study on interface perpendicular MTJ variability

Choi, W. H., Kim, J., Ahmed, I. & Kim, C. H., Aug 3 2015, 73rd Annual Device Research Conference, DRC 2015. Institute of Electrical and Electronics Engineers Inc., p. 89-90 2 p. 7175569. (Device Research Conference - Conference Digest, DRC; vol. 2015-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Assessing the impact of RTN on logic timing margin using a 32nm dual ring oscillator array

Tang, Q. & Kim, C. H., Feb 16 2015, 2015 IEEE International Electron Devices Meeting, IEDM 2015. Institute of Electrical and Electronics Engineers Inc., p. 20.7.1-20.7.4 7409745. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2016-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations
2011

Reliability monitoring ring oscillator structures for isolated/combined NBTI and PBTI measurement in high-k metal gate technologies

Kim, J. J., Linder, B. P., Rao, R. M., Kim, T. H., Lu, P. F., Jenkins, K. A., Kim, C. H., Bansal, A., Mukhopadhyay, S. & Chuang, C. T., Jun 23 2011, 2011 International Reliability Physics Symposium, IRPS 2011. p. 2B.4.1-2B.4.4 5784450. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

18 Scopus citations
2017

Statistical characterization of radiation-induced pulse waveforms and flip-flop soft errors in 14nm tri-gate CMOS using a back-sampling chain (BSC) technique

Kumar, S., Cho, M., Eversen, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Quinn, H., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H., Aug 10 2017, 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., p. C114-C115 8008570. (IEEE Symposium on VLSI Circuits, Digest of Technical Papers).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2014

Scaling analysis of in-plane and perpendicular anisotropy magnetic tunnel junctions using a physics-based model

Kim, J., Zhao, H., Jiang, Y., Klemm, A., Wang, J. P. & Kim, C. H., Jan 1 2014, 72nd Device Research Conference, DRC 2014 - Conference Digest. Institute of Electrical and Electronics Engineers Inc., p. 155-156 2 p. 6872344. (Device Research Conference - Conference Digest, DRC).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations
2015

Circuit techniques for mitigating short-term vth instability issues in successive approximation register (SAR) ADCs

Choi, W. H., Kim, H. & Kim, C. H., Nov 25 2015, 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-November. 7338417

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
2014

A comparative study of single-poly embedded flash memory disturbance, program/erase speed, endurance, and retention characteristic

Song, S. H., Kim, J. & Kim, C. H., Nov 1 2014, In : IEEE Transactions on Electron Devices. 61, 11, p. 3737-3743 7 p., 6918412.

Research output: Contribution to journalArticle

7 Scopus citations
2017

A multi-phase VCO quantizer based adaptive digital LDO in 65nm CMOS technology

Kundu, S. & Kim, C. H., Sep 25 2017, IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050960

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2015

Two-step beat frequency quantizer based ADC with adaptive reference control for low swing bio-potential signals

Kundu, S., Kim, B. & Kim, C. H., Nov 25 2015, 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., 7338382. (Proceedings of the Custom Integrated Circuits Conference; vol. 2015-November).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations
2011

An odomoeter for Cpus

Keane, J. & Kim, C. H., May 1 2011, In : IEEE Spectrum. 48, 5, p. 28-33 6 p., 5753241.

Research output: Contribution to journalArticle

15 Scopus citations
2019

A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing

Park, G., Kim, M., Pande, N., Chiu, P. W., Song, J. & Kim, C. H., Apr 2019, 2019 IEEE Custom Integrated Circuits Conference, CICC 2019. Institute of Electrical and Electronics Engineers Inc., 8780279. (Proceedings of the Custom Integrated Circuits Conference; vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2018

A 65-nm 10-Gb/s 10-mm On-Chip Serial Link Featuring a Digital-Intensive Time-Based Decision Feedback Equalizer

Chiu, P. W., Kundu, S., Tang, Q. & Kim, C. H., Apr 2018, In : IEEE Journal of Solid-State Circuits. 53, 4, p. 1203-1213 11 p.

Research output: Contribution to journalArticle

3 Scopus citations
2017
Open Access
14 Scopus citations
2018

BiometricNet: Deep Learning based Biometric Identification using Wrist-Worn PPG

Everson, L., Biswas, D., Panwar, M., Rodopoulos, D., Acharyya, A., Kim, C. H., Van Hoof, C., Konijnenburg, M. & Van Helleputte, N., Apr 26 2018, 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8350983. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 2018-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations
2014

A bit-by-bit re-writable eflash in a generic 65 nm logic process for moderate-density nonvolatile memory applications

Song, S. H., Chun, K. C. & Kim, C. H., Aug 2014, In : IEEE Journal of Solid-State Circuits. 49, 8, p. 1861-1871 11 p., 6799274.

Research output: Contribution to journalArticle

10 Scopus citations
2018

An ultra-dense irradiation test structure with a NAND/NOR readout chain for characterizing soft error rates of 14nm combinational logic circuits

Kumar, S., Cho, M., Everson, L., Kim, H., Tang, Q., Mazanec, P., Meinerzhagen, P., Malavasi, A., Lake, D., Tokunaga, C., Khellah, M., Tschanz, J., Borkar, S., De, V. & Kim, C. H., Jan 23 2018, 2017 IEEE International Electron Devices Meeting, IEDM 2017. Institute of Electrical and Electronics Engineers Inc., p. 39.3.1-39.3.4 (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2014

Distributed on-chip switched-capacitor DC-DC converters supporting DVFS in multicore systems

Zhou, P., Paul, A., Kim, C. H. & Sapatnekar, S. S., Sep 2014, In : IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 22, 9, p. 1954-1967 14 p., 6609141.

Research output: Contribution to journalArticle

12 Scopus citations
2017
6 Scopus citations
2012

A 667 MHz logic-compatible embedded DRAM featuring an asymmetric 2T gain cell for high speed on-die caches

Chun, K. C., Jain, P., Kim, T. H. & Kim, C. H., Feb 1 2012, In : IEEE Journal of Solid-State Circuits. 47, 2, p. 547-559 13 p., 6081952.

Research output: Contribution to journalArticle

48 Scopus citations
2015

Solution-processed carbon nanotube thin-film complementary static random access memory

Geier, M. L., McMorrow, J. J., Xu, W., Zhu, J., Kim, C. H., Marks, T. J. & Hersam, M. C., Nov 1 2015, In : Nature Nanotechnology. 10, 11, p. 944-948 5 p.

Research output: Contribution to journalArticle

131 Scopus citations
2012

Staggered core activation: A circuit/architectural approach for mitigating resonant supply noise issues in multi-core multi-power domain processors

Paul, A., Amrein, M., Gupta, S., Vinod, A., Arun, A., Sapatnekar, S. S. & Kim, C. H., Nov 26 2012, Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, CICC 2012. 6330673. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations
2017

CoMET: Composite-Input Magnetoelectric-Based Logic Technology

Mankalale, M. G., Liang, Z., Zhao, Z., Kim, C. H., Wang, J. & Sapatnekar, S. S., Dec 2017, In : IEEE Journal on Exploratory Solid-State Computational Devices and Circuits. 3, p. 27-36 10 p., 7893717.

Research output: Contribution to journalArticle

Open Access
15 Scopus citations
2018

A 104.8TOPS/W One-Shot Time-Based Neuromorphic Chip Employing Dynamic Threshold Error Correction in 65nm

Everson, L. R., Liu, M., Pande, N. & Kim, C. H., Dec 14 2018, 2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 273-276 4 p. 8579302. (2018 IEEE Asian Solid-State Circuits Conference, A-SSCC 2018 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations
2017

A Pathway to Enable Exponential Scaling for the Beyond-CMOS Era: Invited

Wang, J. P., Sapatnekar, S. S., Kim, C. H., Crowell, P., Koester, S., Datta, S., Roy, K., Raghunathan, A., Hu, X. S., Niemier, M., Naeemi, A., Chien, C. L., Ross, C. & Kawakami, R., Jun 18 2017, Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., 16. (Proceedings - Design Automation Conference; vol. Part 128280).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
6 Scopus citations
2019

A 3D NAND Flash Ready 8-Bit Convolutional Neural Network Core Demonstrated in a Standard Logic Process

Kim, M., Liu, M., Everson, L., Park, G., Jeon, Y., Kim, S., Lee, S., Song, S. & Kim, C. H., Dec 2019, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993574. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2019-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

CorNET: Deep Learning Framework for PPG-Based Heart Rate Estimation and Biometric Identification in Ambulant Environment

Biswas, D., Everson, L., Liu, M., Panwar, M., Verhoef, B. E., Patki, S., Kim, C. H., Acharyya, A., Van Hoof, C., Konijnenburg, M. & Van Helleputte, N., Apr 2019, In : IEEE transactions on biomedical circuits and systems. 13, 2, p. 282-291 10 p., 8607019.

Research output: Contribution to journalArticle

26 Scopus citations

A 68 Parallel Row Access Neuromorphic Core with 22K Multi-Level Synapses Based on Logic-Compatible Embedded Flash Memory Technology

Kim, M., Kim, J., Park, C., Everson, L., Kim, H., Song, S., Lee, S. & Kim, C. H., Jan 16 2019, 2018 IEEE International Electron Devices Meeting, IEDM 2018. Institute of Electrical and Electronics Engineers Inc., p. 15.4.1-15.4.4 8614599. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2018-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Scopus citations
2014

Aerosol jet printed, Sub-2 v complementary circuits constructed from P-and N-type electrolyte gated transistors

Hong, K., Kim, Y. H., Kim, S. H., Xie, W., Xu, W. D., Kim, C. H. & Frisbie, C. D., Jan 1 2014, In : Advanced Materials. 26, 41, p. 7032-7037 6 p.

Research output: Contribution to journalArticle

49 Scopus citations
2017

Reliable PUF-Based Local Authentication With Self-Correction

Lao, Y., Yuan, B., Kim, C. H. & Parhi, K. K., Feb 2017, In : IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 36, 2, p. 201-213 13 p., 7470631.

Research output: Contribution to journalArticle

Open Access
20 Scopus citations
2016

Mode-based obfuscation using control-flow modifications

Koteshwara, S., Kim, C. H. & Parhi, K. K., Jan 20 2016, Proceedings of the 3rd Workshop on Cryptography and Security in Computing Systems, CS2 2016. Association for Computing Machinery, p. 19-24 6 p. (ACM International Conference Proceeding Series; vol. 20-January-2016).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
4 Scopus citations
2015

Fault-tolerant ripple-carry binary adder using partial triple modular redundancy (PTMR)

Parhi, R., Kim, C. H. & Parhi, K. K., Jan 1 2015, 2015 IEEE International Symposium on Circuits and Systems, ISCAS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-July. p. 41-44 4 p. 7168565

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations

An 8bit, 2.6ps two-step TDC in 65nm CMOS employing a switched ring-oscillator based time amplifier

Kim, B., Kim, H. & Kim, C. H., Nov 25 2015, 2015 IEEE Custom Integrated Circuits Conference, CICC 2015. Institute of Electrical and Electronics Engineers Inc., 7338425. (Proceedings of the Custom Integrated Circuits Conference; vol. 2015-November).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

11 Scopus citations
2017

Predicting hard and soft-responses and identifying stable challenges of MUX PUFs using ANNs

Avvaru, S. V. S., Zhou, C., Kim, C. H. & Parhi, K. K., Sep 27 2017, 2017 IEEE 60th International Midwest Symposium on Circuits and Systems, MWSCAS 2017. Institute of Electrical and Electronics Engineers Inc., p. 934-937 4 p. 8053078. (Midwest Symposium on Circuits and Systems; vol. 2017-August).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

7 Scopus citations

Secure and Reliable XOR Arbiter PUF Design: An Experimental Study based on 1 Trillion Challenge Response Pair Measurements

Zhou, C., Parhi, K. K. & Kim, C. H., Jun 18 2017, Proceedings of the 54th Annual Design Automation Conference 2017, DAC 2017. Institute of Electrical and Electronics Engineers Inc., 10. (Proceedings - Design Automation Conference; vol. Part 128280).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

22 Scopus citations
2018

Predicting Soft-Response of MUX PUFs via Logistic Regression of Total Delay Difference

Koyily, A., Zhou, C., Kim, C. H. & Parhi, K. K., Apr 26 2018, 2018 IEEE International Symposium on Circuits and Systems, ISCAS 2018 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 8351487. (Proceedings - IEEE International Symposium on Circuits and Systems; vol. 2018-May).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2017

Hierarchical functional obfuscation of integratec circuits using a mode-based approach

Koteshwara, S., Kim, C. H. & Parhi, K. K., Sep 25 2017, IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050319. (Proceedings - IEEE International Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

An entropy test for determining whether a MUX PUF is linear or nonlinear

Koyily, A., Zhou, C., Kim, C. H. & Parhi, K. K., Sep 25 2017, IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050670. (Proceedings - IEEE International Symposium on Circuits and Systems).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2019

Leveraging Circuit Reliability Effects for Designing Robust and Secure Physical Unclonable Functions

Kim, M., Park, G., Chiu, P. & Kim, C. H., Dec 2019, 2019 IEEE International Electron Devices Meeting, IEDM 2019. Institute of Electrical and Electronics Engineers Inc., 8993667. (Technical Digest - International Electron Devices Meeting, IEDM; vol. 2019-December).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

BioTranslator: Inferring R-Peaks from Ambulatory Wrist-Worn PPG Signal

Everson, L., Biswas, D., Verhoef, B. E., Kim, C. H., Van Hoof, C., Konijnenburg, M. & Van Helleputte, N., Jul 2019, 2019 41st Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBC 2019. Institute of Electrical and Electronics Engineers Inc., p. 4241-4245 5 p. 8856450. (Proceedings of the Annual International Conference of the IEEE Engineering in Medicine and Biology Society, EMBS).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2014

SRAM read performance degradation under asymmetric NBTI and PBTI stress: Characterization vehicle and statistical aging data

Wang, X., Xu, W. & Kim, C. H., Nov 4 2014, Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014. Institute of Electrical and Electronics Engineers Inc., 6946132. (Proceedings of the IEEE 2014 Custom Integrated Circuits Conference, CICC 2014).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Scopus citations
2012

Impact of interconnect length on BTI and HCI induced frequency degradation

Wang, X., Jain, P., Jiao, D. & Kim, C. H., Sep 28 2012, 2012 IEEE International Reliability Physics Symposium, IRPS 2012. p. 2F.5.1-2F.5.6 6241798. (IEEE International Reliability Physics Symposium Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

9 Scopus citations
2017

A 10Gb/s 10mm on-chip serial link in 65nm CMOS featuring a half-rate time-based decision feedback equalizer

Chiu, P., Kundu, S., Tang, Q. & Kim, C. H., Aug 10 2017, 2017 Symposium on VLSI Circuits, VLSI Circuits 2017. Institute of Electrical and Electronics Engineers Inc., p. C56-C57 8008546. (IEEE Symposium on VLSI Circuits, Digest of Technical Papers).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations
2012

A 32nm SRAM reliability macro for recovery free evaluation of NBTI and PBTI

Jain, P., Paul, A., Wang, X. & Kim, C. H., Dec 1 2012, 2012 IEEE International Electron Devices Meeting, IEDM 2012. 6479014. (Technical Digest - International Electron Devices Meeting, IEDM).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Scopus citations
2015

A revolving reference odometer circuit for BTI-induced frequency fluctuation measurements under fast DVFS transients

Satapathy, S., Choi, W. H., Wang, X. & Kim, C. H., Jan 1 2015, 2015 IEEE International Reliability Physics Symposium, IRPS 2015. Institute of Electrical and Electronics Engineers Inc., Vol. 2015-May. p. 6A31-6A35 7112757

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations
2019

2.5 A 40×40 Four-Neighbor Time-Based In-Memory Computing Graph ASIC Chip Featuring Wavefront Expansion and 2D Gradient Control

Everson, L. R., Sapatnekar, S. S. & Kim, C. H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 50-52 3 p. 8662455. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
2012

Optimization of on-chip switched-capacitor DC-DC converters for high-performance applications

Zhou, P., Choi, W. H., Kim, B., Kim, C. H. & Sapatnekar, S. S., Dec 1 2012, In : IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD. p. 263-270 8 p., 6386619.

Research output: Contribution to journalConference article

12 Scopus citations