1/f noise measurements of interacting current filaments in hydrogenated amorphous silicon

C. E. Parman, N. E. Israeloff, J. Fan, J. Kakalios

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The coplanar current in n-type doped hydrogenated amorphous silicon (a-Si:H) displays random telegraph switching noise, indicating the presence of inhomogeneous current filaments whose conductance varies with time. There are strong correlations of the 1/f noise power spectra across differing frequency octaves which are much larger than expected if the magnitudes of the fluctuators are varied in parallel. The scale invariant second spectra and the temperature dependence of the spectral slope indicate that hydrogen motion is involved in the cooperative dynamics between noise sources. A model is described wherein the properties of the current filaments are modulated by hydrogen-hydrogen interactions which are mediated by the Si strain fields.

Original languageEnglish (US)
Title of host publicationAmorphous Silicon Technology
PublisherPubl by Materials Research Society
Pages309-314
Number of pages6
ISBN (Print)155899193X, 9781558991934
DOIs
StatePublished - Jan 1 1993
EventProceedings of the MRS Spring Meeting - San Francisco, CA, USA
Duration: Apr 13 1993Apr 16 1993

Publication series

NameMaterials Research Society Symposium Proceedings
Volume297
ISSN (Print)0272-9172

Other

OtherProceedings of the MRS Spring Meeting
CitySan Francisco, CA, USA
Period4/13/934/16/93

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