15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm

Anastacia Alvarez, Wenfeng Zhao, Massimo Alioto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

51 Scopus citations

Abstract

Physically unclonable functions (PUFs) enable information security down to the chip level [1-4]. Arrays of PUF bitcells (Fig. 14.3.1) generate chip-specific keys that are unpredictable, repeatable and cannot be measured externally, thus uniquely identifying the die to counteract chip piracy/counterfeiting and enable lightweight authentication/encryption [1-4]. In silicon PUFs, trustworthy bit generation is achieved by accentuating local process variations through various circuit principles (e.g., delay mismatch) and rejecting global process/voltage/temperature (PVT) variations, layout-dependent process variations and noise [2].

Original languageEnglish (US)
Title of host publication2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages256-257
Number of pages2
Volume58
ISBN (Electronic)9781479962235
DOIs
StatePublished - Jan 1 2015
Event2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers - San Francisco, United States
Duration: Feb 22 2015Feb 26 2015

Other

Other2015 62nd IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers
CountryUnited States
CitySan Francisco
Period2/22/152/26/15

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Alvarez, A., Zhao, W., & Alioto, M. (2015). 15fJ/b static physically unclonable functions for secure chip identification with <2% native bit instability and 140× Inter/Intra PUF hamming distance separation in 65nm. In 2015 IEEE International Solid-State Circuits Conference, ISSCC 2015 - Digest of Technical Papers (Vol. 58, pp. 256-257). [7063023] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISSCC.2015.7063023