1988 …2019
If you made any changes in Pure, your changes will be visible here soon.

Research Output 1988 2019

Filter
Conference article
Conference article
7 Citations (Scopus)

Characterizing a single hot-electron-induced trap in submicron MOSFET using random telegraph noise

Fang, P., Hung, K. K., Ko, P. K. & Hu, C., Dec 1 1990, In : Digest of Technical Papers - Symposium on VLSI Technology. p. 37-38 2 p., 5727456.

Research output: Contribution to journalConference article

Telegraph
Hot electrons
Scattering
Drain current
Fermi level
30 Citations (Scopus)

Design in hot-carrier reliability for high performance logic applications

Fang, P., Tao, J., Chen, J. F. & Hu, C., Jan 1 1998, In : Proceedings of the Custom Integrated Circuits Conference. p. 525-531 7 p.

Research output: Contribution to journalConference article

Hot carriers
Degradation
Networks (circuits)
Logic design
Calibration

Generation-recombination noise in GaAs p+-i-n+ diodes

Lin, H. S., Colestock, P. A., Fang, P. & Chen, T. M., Dec 1 1989, In : Conference Proceedings - IEEE SOUTHEASTCON. 3, p. 1295-1297 3 p.

Research output: Contribution to journalConference article

Diodes
Activation energy
Temperature
28 Citations (Scopus)

Hot carrier induced degradation in deep submicron MOSFETs at 100 °C

Li, E., Rosenbaum, E., Register, L. F., Tao, J. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 103-107 5 p.

Research output: Contribution to journalConference article

Hot carriers
Degradation
Networks (circuits)
Testing
Temperature

Optimal doping profile for laser-induced diode linking in wafer-scale-integration

Fang, P., Sun, M. I. & Chen, T. M., Dec 1 1989, In : Conference Proceedings - IEEE SOUTHEASTCON. 3, p. 1421-1423 3 p.

Research output: Contribution to journalConference article

WSI circuits
Diodes
Doping (additives)
Lasers
Lagrange multipliers

Performance and reliability of asymmetric LDD devices and logic gates

Chen, J. F., Tao, J., Fang, P. & Hu, C., Jan 1 1998, In : Proceedings of the Custom Integrated Circuits Conference. p. 533-536 4 p.

Research output: Contribution to journalConference article

Hot carriers
Logic gates
Carrier lifetime
11 Citations (Scopus)

Reliability simulator for interconnect and intermetallic contact electromigration

Liew, B. K., Fang, P., Cheung, N. W. & Hu, C., Dec 1 1990, In : Annual Proceedings - Reliability Physics (Symposium). p. 111-118 8 p.

Research output: Contribution to journalConference article

Electromigration
Intermetallics
Simulators
Networks (circuits)
Safety factor