1988 …2019
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Research Output 1988 2019

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Conference contribution
2019

A multiplexing ripple cancellation LED driver with true single-stage power conversion and flicker-free operation

Fang, P., Liu, Y. F. & Sen, P. C., May 24 2019, 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. Institute of Electrical and Electronics Engineers Inc., p. 3414-3420 7 p. 8722000. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC; vol. 2019-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Multiplexing
Light emitting diodes
Electric potential
Energy transfer
Lighting
2011

The research of photovoltaic street light control system with MPPT

Fang, P. & Wang, P., Jul 15 2011, 2011 3rd International Workshop on Intelligent Systems and Applications, ISA 2011 - Proceedings. 5873298. (2011 3rd International Workshop on Intelligent Systems and Applications, ISA 2011 - Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Control systems
Photovoltaic cells
DC-DC converters
Conversion efficiency
Controllers
1999
58 Citations (Scopus)

Hot carrier effects in nMOSFETs in 0.1μm CMOS technology

Li, E., Rosenbaum, E., Tao, J., Yeap, G. C. F., Lin, M. R. & Fang, P., Jan 1 1999, Annual Proceedings - Reliability Physics (Symposium). Institute of Electrical and Electronics Engineers Inc., p. 253-258 6 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carriers
Bias currents
Carrier lifetime
Deuterium
Metallizing
4 Citations (Scopus)

Use of a WLR technique to characterize voiding in 0.25 and 0.18 μm technologies for integrated circuits

Marathe, A., Besser, P., Tsiang, J., Tran, K., Pham, V., Tracy, B. & Fang, P., Jan 1 1999, Annual Proceedings - Reliability Physics (Symposium). IEEE, p. 291-295 5 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Integrated circuits
Process monitoring
Metals
1994
5 Citations (Scopus)

Accurate simulation of EPROM hot-carrier induced degradation using physics based interface and oxide charge generation models

Peng, J. Z., Lin, Q., Fang, P., Kwan, M., Longcor, S. & Lien, J., Jan 1 1994, Annual Proceedings - Reliability Physics (Symposium). Publ by IEEE, p. 154-160 7 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carriers
Physics
Degradation
Oxides
Interface states
3 Citations (Scopus)

iRULE: fast hot-carrier reliability diagnosis using macro-models

Teng, C. C., Sun, W., Kang, S. M., Fang, P. & Yue, J., Jan 1 1994, Proceedings of the Custom Integrated Circuits Conference. Anon (ed.). Publ by IEEE, p. 421-424 4 p. (Proceedings of the Custom Integrated Circuits Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carriers
Macros
Transistors
Networks (circuits)
VLSI circuits
1993
11 Citations (Scopus)

Process induced oxide damage and its implications to device reliability of submicron transistors

Rakkhit, R., Heiler, F. P., Fang, P. & Sander, C., Jan 1 1993, Annual Proceedings - Reliability Physics (Symposium). Publ by IEEE, p. 292-296 5 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Transistors
Oxides
Antennas
Hot carriers
Deterioration
1992
4 Citations (Scopus)

A method to project hot carrier induced punch through voltage reduction for deep submicron LDD PMOS FETs at room and elevated temperatures

Fang, P., Yue, J. T. & Wollessen, D., Mar 1 1992, Annual Proceedings - Reliability Physics (Symposium). Publ by IEEE, p. 131-135 5 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carriers
Hot electrons
Field effect transistors
Electric potential
High temperature effects
8 Citations (Scopus)

Interface quality of SOI MOSFET's reflected in noise and mobility

Chen, J., Lee, A., Fang, P., Solomon, R., Chan, T., Ko, P. & Hu, C., Jan 1 1992, 1991 IEEE International SOI Conference Proceedings. Publ by IEEE, p. 100-101 2 p. (1991 IEEE International SOI Conference Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Silicon
Transistors
Oxygen
18 Citations (Scopus)

Simulation of CMOS circuit degradation due to hot-carrier effects

Quader, K. N., Ko, P. K., Hu, C., Fang, P. & Yue, J. T., Mar 1 1992, Annual Proceedings - Reliability Physics (Symposium). Publ by IEEE, p. 16-23 8 p. (Annual Proceedings - Reliability Physics (Symposium)).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Hot carriers
Degradation
Networks (circuits)
Transistors
Drain current
1990
29 Citations (Scopus)

Noise overshoot at drain current kink in SOI MOSFET

Chen, J., Fang, P., Ko, P. K., Hu, C., Solomon, R., Chan, T. Y. & Sodini, C. G., Jan 1 1990, 1990 IEEE SOS/SOI Technology Conference, Proceedings. Institute of Electrical and Electronics Engineers Inc., p. 40-41 2 p. 145699. (1990 IEEE SOS/SOI Technology Conference, Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Drain current
Networks (circuits)
1989

Reliability and resistance minimization studies of the laser diffused diode links in wafer-scale-integration

Fang, P., Massiha, G. H., Chen, T. M. & Cottle, J. G., Jan 1 1989, ESSDERC 1989 - Proceedings of the 19th European Solid State Device Research Conference. Ryssel, H., Heuberger, A. & Lange, P. (eds.). IEEE Computer Society, p. 837-840 4 p. 5436471. (European Solid-State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

WSI circuits
Electromigration
Semiconductor lasers
Joule heating
Oxides