1988 …2019
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Fingerprint The Fingerprint is created by mining the titles and abstracts of the person's research outputs and projects/funding awards to create an index of weighted terms from discipline-specific thesauri.

  • 7 Similar Profiles
Hot carriers Engineering & Materials Science
Oxides Engineering & Materials Science
Degradation Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Electromigration Engineering & Materials Science
Carrier lifetime Engineering & Materials Science
Hot electrons Engineering & Materials Science
Transistors Engineering & Materials Science

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Research Output 1988 2019

A multiplexing ripple cancellation LED driver with true single-stage power conversion and flicker-free operation

Fang, P., Liu, Y. F. & Sen, P. C., May 24 2019, 34th Annual IEEE Applied Power Electronics Conference and Exposition, APEC 2019. Institute of Electrical and Electronics Engineers Inc., p. 3414-3420 7 p. 8722000. (Conference Proceedings - IEEE Applied Power Electronics Conference and Exposition - APEC; vol. 2019-March).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Multiplexing
Light emitting diodes
Electric potential
Energy transfer
Lighting
35 Citations (Scopus)

Projecting lifetime of deep submicron MOSFETs

Li, E., Rosenbaum, E., Tao, J. & Fang, P., Apr 1 2001, In : IEEE Transactions on Electron Devices. 48, 4, p. 671-678 8 p.

Research output: Contribution to journalArticle

Degradation
Hot carriers
Deuterium
Electric potential
Metallizing
27 Citations (Scopus)

Anode hole injection versus hydrogen release: The mechanism for gate oxide breakdown

Wu, J., Rosenbaum, E., MacDonald, B., Li, E., Tao, J., Tracy, B. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 27-32 6 p.

Research output: Contribution to journalArticle

Deuterium
Anodes
Hydrogen
Oxides
Metallizing

Hot carrier induced degradation in deep submicron MOSFETs at 100 °C

Li, E., Rosenbaum, E., Register, L. F., Tao, J. & Fang, P., Jan 1 2000, In : Annual Proceedings - Reliability Physics (Symposium). p. 103-107 5 p.

Research output: Contribution to journalConference article

Hot carriers
Degradation
Networks (circuits)
Testing
Temperature

Model parameter extraction for MOSFETs hot carrier degradation/Age

Yang, M., Yu, Q., Wang, X., Chen, Y., Liu, Y., Xiao, B., Yang, P. & Fang, P., Mar 1 2000, In : Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors. 21, 3, p. 268-273 6 p.

Research output: Contribution to journalArticle

Parameter extraction
Hot carriers
field effect transistors
degradation
Complement Factor H