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Research Output 1995 2019

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Review article
2007
37 Citations (Scopus)

A review of the systems approach to the analysis of dynamic-mode atomic force microscopy

Sebastian, A., Gannepalli, A. & Salapaka, M. V., Dec 1 2007, In : IEEE Transactions on Control Systems Technology. 15, 5 SPEC. ISS., p. 952-959 8 p.

Research output: Contribution to journalReview article

Atomic force microscopy
Microscopes
System theory
Frequency response
Identification (control systems)