Fingerprint The Fingerprint is created by mining the titles and abstracts of the person's research outputs and projects/funding awards to create an index of weighted terms from discipline-specific thesauri.

  • 19 Similar Profiles
Hardware Engineering & Materials Science
Decoding Engineering & Materials Science
Digital filters Engineering & Materials Science
Throughput Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Electric power utilization Engineering & Materials Science
Adders Engineering & Materials Science
Digital signal processing Engineering & Materials Science

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Projects 2008 2018

Research Output 1986 2018

Integrated circuits
Networks (circuits)
Ethernet
Fast Fourier transforms
Hardware

A data remanence based approach to generate 100% stable keys from an SRAM physical unclonable function

Liu, M., Zhou, C., Tang, Q., Parhi, K. K. & Kim, C. H. Aug 11 2017 ISLPED 2017 - IEEE/ACM International Symposium on Low Power Electronics and Design. Institute of Electrical and Electronics Engineers Inc., 8009192

Research output: ResearchConference contribution

Remanence
Static random access storage
Hardware security
Aging of materials
Networks (circuits)

A DRAM based physical unclonable function capable of generating >1032 Challenge Response Pairs per 1Kbit array for secure chip authentication

Tang, Q., Zhou, C., Choi, W., Kang, G., Park, J., Parhi, K. K. & Kim, C. H. Jul 26 2017 38th Annual Custom Integrated Circuits Conference: A Showcase for Integrated Circuit Design in Silicon Hills, CICC 2017. Institute of Electrical and Electronics Engineers Inc., Vol. 2017-April, 7993610

Research output: ResearchConference contribution

Dynamic random access storage
Authentication
Hardware security
Electric potential
Data storage equipment

Analysis of stochastic logic circuits in unipolar, bipolar and hybrid formats

Parhi, K. K. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050568

Research output: ResearchConference contribution

Logic circuits
Fault tolerance
Polynomials
Networks (circuits)

An entropy test for determining whether a MUX PUF is linear or nonlinear

Koyily, A., Zhou, C., Kim, C. H. & Parhi, K. K. Sep 25 2017 IEEE International Symposium on Circuits and Systems: From Dreams to Innovation, ISCAS 2017 - Conference Proceedings. Institute of Electrical and Electronics Engineers Inc., 8050670

Research output: ResearchConference contribution

Entropy