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  • 3 Similar Profiles
CMOS Physics & Astronomy
Hot carriers Engineering & Materials Science
Transistors Engineering & Materials Science
Oxides Engineering & Materials Science
Networks (circuits) Engineering & Materials Science
Bipolar transistors Engineering & Materials Science
Degradation Engineering & Materials Science
Dosimetry Engineering & Materials Science

Projects 2014 2020

Research Output 1982 1997

Screening SOI substrates for radiation resistant space electronics applications

Liu, S. T., Yue, J. & Schrankler, J., Dec 1 1997, p. 7-9. 3 p.

Research output: Contribution to conferencePaper

Silicon
Oxides
Screening
Electronic equipment
Oxygen
thresholds
Electric potential
electric potential
19 Citations

Switching Characteristics of Scaled CMOS Circuits at 77 K

Huang, J. S. T. & Schrankler, J. W., Jan 1 1987, In : IEEE Transactions on Electron Devices. 34, 1, p. 101-106 6 p.

Research output: Contribution to journalArticle

Networks (circuits)
Liquid nitrogen
Temperature
Electric potential

ENHANCED FULLY SCALED 1. 2- mu M CMOS PROCESS FOR ANALOG APPLICATIONS.

Reich, R. K., Rahn, C. H., Holt, M. S., Schrankler, J. W., Ju, D. H. & Kirchner, G. D., Apr 1 1986, In : IEEE Journal of Solid-State Circuits. SC-21, 2, p. 293-296 4 p.

Research output: Contribution to journalArticle

Analog circuits
Resistors
Packaging
Transistors
Capacitors
5 Citations

Radiation-Dependent Hot-Carrier Effects

Reich, R. K., Schrankler, J. W., Ju, D. H., Holt, M. S. & Kirchner, G. D., Jan 1 1986, In : IEEE Electron Device Letters. 7, 4, p. 235-237 3 p.

Research output: Contribution to journalArticle

Hot carriers
Ionizing radiation
Radiation
Degradation
Fabrication