Greg D Haugstad

Dr.

1989 …2020

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  • 2013

    Guide to Best Practices for AFM Users

    Haugstad, G., Nov 8 2013, Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, p. 150-161 12 p.

    Research output: Chapter in Book/Report/Conference proceedingChapter

  • Nanomechanical characterization of biomaterial surfaces: Polymer coatings that elute drugs

    Wormuth, K. & Haugstad, G., Nov 8 2013, Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, p. 323-341 19 p.

    Research output: Chapter in Book/Report/Conference proceedingChapter

  • Phase Imaging

    Yablon, D. G. & Haugstad, G., Nov 8 2013, Scanning Probe Microscopy for Industrial Applications: Nanomechanical Characterization. Wiley, p. 95-114 20 p.

    Research output: Chapter in Book/Report/Conference proceedingChapter

    1 Scopus citations