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Chris H. Kim

20022020

Research output per year

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Projects

Silicon odometer design

Kim, C. H.

INERTIALWAVE, INC

3/30/20 → 7/26/20

Project: Research project

Characterization and Mitigation of Electromigration Effects in Advanced Technology Nodes

Kim, C. H.

University of Texas at Dallas

1/1/20 → 12/31/22

Project: Research project

    • Extreme Temperature Digital, Analog, and Mixed-Signal Circuits (ET-DAMS)

    Kim, C. H.

    University of Texas at Dallas

    1/1/20 → 12/31/22

    Project: Research project

    • SHF: Medium: Time Based Deep Neural Networks: An Integra

    Kim, C. H., Sapatnekar, S. S. & Zhao, Q.

    National Science Foundation

    5/1/18 → 4/30/22

    Project: Research project

    • E2CDA: Type 1: Collaborative Research: Probabilistic Spi

    Wang, J. & Kim, C. H.

    Purdue University

    1/1/18 → 12/31/20

    Project: Research project

    Research Output

    A 32Gb/s Digital-Intensive Single-Ended PAM-4 Transceiver for High-Speed Memory Interfaces Featuring a 2-Tap Time-Based Decision Feedback Equalizer and an In-Situ Channel-Loss Monitor

    Chiu, P. W. & Kim, C., Feb 2020, 2020 IEEE International Solid-State Circuits Conference, ISSCC 2020. Institute of Electrical and Electronics Engineers Inc., p. 336-338 3 p. 9063137. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2020-February).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    • A Shortest Path Finding Time-Based Accelerator Core with Built-in Gravity Control and Buffer Zone for Smooth 3-D Navigation

    Everson, L. R., Song, J., Sapatnekar, S. S. & Kim, C. H., 2020, In : IEEE Solid-State Circuits Letters. 3, p. 66-69 4 p., 9097891.

    Research output: Contribution to journal › Article

    • Electromigration Effects in Power Grids Characterized from a 65 nm Test Chip

    Zhou, C., Fung, R., Wen, S. J., Wong, R. & Kim, C. H., Mar 2020, In : IEEE Transactions on Device and Materials Reliability. 20, 1, p. 74-83 10 p., 8915815.

    Research output: Contribution to journal › Article

    • Understanding the Key Parameter Dependences Influencing the Soft-Error Susceptibility of Standard Combinational Logic

    Pande, N., Kumar, S., Everson, L. R. & Kim, C. H., Jan 2020, In : IEEE Transactions on Nuclear Science. 67, 1, p. 116-125 10 p., 8933129.

    Research output: Contribution to journal › Article

    • 2.5 A 40×40 Four-Neighbor Time-Based In-Memory Computing Graph ASIC Chip Featuring Wavefront Expansion and 2D Gradient Control

    Everson, L. R., Sapatnekar, S. S. & Kim, C. H., Mar 6 2019, 2019 IEEE International Solid-State Circuits Conference, ISSCC 2019. Institute of Electrical and Electronics Engineers Inc., p. 50-52 3 p. 8662455. (Digest of Technical Papers - IEEE International Solid-State Circuits Conference; vol. 2019-February).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

    • 2 Scopus citations