Projects per year
Personal profile
Expertise related to UN Sustainable Development Goals
In 2015, UN member states agreed to 17 global Sustainable Development Goals (SDGs) to end poverty, protect the planet and ensure prosperity for all. This person’s work contributes towards the following SDG(s):
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Grid Optimization and Silicon Validation for Chip Robustness
1/1/22 → 12/31/22
Project: Research project
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Quantum-Inspired CMOS Ising Accelerators
SEMICONDUCTOR RESEARCH CORPORATION
1/1/21 → 12/31/22
Project: Research project
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Early and Late Life Failure Prediction Methods for Analog and Mixed-Signal Circuits
1/1/21 → 6/30/22
Project: Research project
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Characterization and Mitigation of Electromigration Effects in Advanced Technology Nodes
1/1/20 → 12/31/22
Project: Research project
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A 16nm All-digital Hardware Monitor for Evaluating Electromigration effects in Signal Interconnects through Bit-Error-Rate Tracking
Pande, N., Zhou, C., Lin, MH., Fung, R., Wong, R., Wen, S. J. & Kim, C. H., 2022, (Accepted/In press) In: IEEE Transactions on Device and Materials Reliability.Research output: Contribution to journal › Article › peer-review
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A 32Gb/s Time-Based PAM-4 Transceiver for High-Speed DRAM Interfaces With In-Situ Channel Loss and Bit-Error-Rate Monitors
Chiu, P. W. & Kim, C. H., May 1 2022, In: IEEE Transactions on Circuits and Systems I: Regular Papers. 69, 5, p. 1943-1951 9 p.Research output: Contribution to journal › Article › peer-review
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A Back-Sampling Chain Technique for Accelerated Detection, Characterization, and Reconstruction of Radiation-Induced Transient Pulses
Kumar, S., Cho, M., Everson, L. R., Malavasi, A., Lake, D., Tokunaga, C., Khellah, M., Tschanz, J. W., De, V. & Kim, C. H., Dec 1 2021, In: IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29, 12, p. 2086-2097 12 p.Research output: Contribution to journal › Article › peer-review
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An All BTI (N-PBTI, N-NBTI, P-PBTI, P-NBTI) Odometer based on a Dual Power Rail Ring Oscillator Array
Park, G., Yu, H., Kim, M. & Kim, C. H., Mar 2021, 2021 IEEE International Reliability Physics Symposium, IRPS 2021 - Proceedings. Institute of Electrical and Electronics Engineers Inc., 9405181. (2021 IEEE International Reliability Physics Symposium (IRPS)).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
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An Embedded nand Flash-Based Compute-In-Memory Array Demonstrated in a Standard Logic Process
Kim, M., Liu, M., Everson, L. R. & Kim, C. H., Jan 1 2021, In: IEEE Journal of Solid-State Circuits. 57, 2, p. 625-638 14 p.Research output: Contribution to journal › Article › peer-review