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  • 8 Similar Profiles
Molecular beam epitaxy Engineering & Materials Science
molecular beam epitaxy Physics & Astronomy
Carrier concentration Engineering & Materials Science
Oxides Chemical Compounds
Heterojunctions Engineering & Materials Science
Perovskite Engineering & Materials Science
Tamper resistant packaging Chemical Compounds
oxides Physics & Astronomy

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Projects 1998 2021

Research Output 2007 2018

  • 46 Article
  • 2 Conference contribution
  • 1 Comment/debate
  • 1 Conference article

Demonstration of a Depletion-Mode SrSnO3 n-Channel MESFET

Chaganti, V. R. S. K., Prakash, A., Yue, J., Jalan, B. & Koester, S. J., Jul 27 2018, (Accepted/In press) In : IEEE Electron Device Letters.

Research output: Contribution to journalArticle

MESFET devices
Capacitance measurement
Ohmic contacts
Voltage measurement

Depletion Mode MOSFET Using La-Doped BaSnO3 as a Channel Material

Yue, J., Prakash, A., Robbins, M. C., Koester, S. J. & Jalan, B., Jun 27 2018, In : ACS Applied Materials and Interfaces. 10, 25, p. 21061-21065 5 p.

Research output: Contribution to journalArticle

Tamper resistant packaging
Field effect transistors
Gate dielectrics
Epitaxial layers
1 Citations

Electronic structure of BaSnO3 investigated by high-energy-resolution electron energy-loss spectroscopy and ab initio calculations

Yun, H., Topsakal, M., Prakash, A., Ganguly, K., Leighton, C., Jalan, B., Wentzcovitch, R. M., Mkhoyan, K. A. & Jeong, J. S., May 1 2018, In : Journal of Vacuum Science and Technology A. 36, 3, 031503

Research output: Contribution to journalArticle

Electron energy loss spectroscopy
Electronic structure
energy dissipation
electron energy
electronic structure

Ferromagnetism and spin-dependent transport at a complex oxide interface

Ayino, Y., Xu, P., Tigre-lazo, J., Yue, J., Jalan, B. & Pribiag, V. S., 2018, In : Physical Review Materials. 2, 3

Research output: Contribution to journalArticle

1 Citations

Frequency- and temperature-dependent dielectric response in hybrid molecular beam epitaxy-grown BaSnO3 films

Nunn, W., Prakash, A., Bhowmik, A., Haislmaier, R., Yue, J., Garcia Lastra, J. M. & Jalan, B., Jun 1 2018, In : APL Materials. 6, 6, 066107

Research output: Contribution to journalArticle

Molecular beam epitaxy
Disease control
Point defects
Dielectric losses