Organization profile

Organization profile

The Characterization Facility is a multi-user, shared instrumentation facility for materials research spanning from nanotechnology to biology and medicine.  Our analytical capabilities include microscopy via electron beams, force probes and visible light, including cryogenic methods; elemental and chemical imaging including depth profiling; elemental, chemical and mass spectrometry; atomic and molecular structure analysis via X-ray, ion or electron scattering; nanomechanical and nanotribological probes; and other tools for surface and thin-film metrology. Equipment includes: Small- and Wide-angle X-ray Scattering (including micro), Scanning probe microscopes (including environmental) and nanoindentors, Ion Beam Analysis (RBS, FReS, PIXE, NRA), Surface analysis (XPS, Auger, micro-contact angle), Scanning and Transmission Electron Microscopy (including cryo/bio, EDS/EELS, EBSD, cathodolum.), Infrared and Raman spectroscopy and microscopy, stylus and light profilometry, spectroscopic ellipsometry and light microscopy; training/rental of all of the above; work with externals (industry/academic/government), educational outreach; internal curricular usage.

Fingerprint Dive into the research topics where Characterization Facility is active. These topic labels come from the works of this organization's members. Together they form a unique fingerprint.

Microscopic examination Engineering & Materials Science
Polymers Chemical Compounds
Atomic force microscopy Engineering & Materials Science
Temperature Chemical Compounds
microscopy Physics & Astronomy
Friction Engineering & Materials Science
Gallium Chemical Compounds
Oxygen Chemical Compounds

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No photo of Javier Garcia Barriocanal
No photo of Robert S Hafner

Robert S Hafner

Person: Researcher

No photo of Greg D Haugstad

Greg D Haugstad

Person: Researcher


Projects 2004 2019

Research Output 1989 2019

2 Citations (Scopus)

Compression-Induced Polymorphic Transformation in Tablets: Role of Shear Stress and Development of Mitigation Strategies

Thakral, N. K., Thakral, S., Stephenson, G. A., Sedlock, R. & Suryanarayanan, R., Jan 1 2019, In : Journal of Pharmaceutical Sciences. 108, 1, p. 476-484 9 p.

Research output: Contribution to journalArticle

Hydrostatic Pressure
Noble Gases

Infinite-randomness fixed point of the quantum superconductor-metal transitions in amorphous thin films

Lewellyn, N. A., Percher, I. M., Nelson, J., Garcia Barriocanal, J., Volotsenko, I., Frydman, A., Vojta, T. & Goldman, A. M., Feb 25 2019, In : Physical Review B. 99, 5, 054515.

Research output: Contribution to journalArticle

Amorphous films
Superconducting materials
Transition metals
Scaling laws
transition metals