The Hitachi S3500N Variable Pressure Scanning Electron Microscope (SEM). Quartz PCI digital imaging, Stage with motor driven X & Y axes, Environmental Secondary Electron Detector (ESED), Absorbed Electron EBIC detector, Robinson Backscattered Electron Detector (BSE), standard Secondary Electron Detector (SED), Infrared ChamberScope, Windows NT Operating System, Emitech K-1150 Cryogenic System, with cryo-prep unit, airlock interface to SEM, sputter coater.
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