Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2



This data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.

All TEM images are in .dm3 or .tif file formats, which can be accessed by Gatan DigitalMicrograph software. The AFM data showing topographic mapping were provided in .gwy and .txt file formats. Detailed description of the simulation data is provided in a readme file.

Funding information
Sponsorship: National Science Foundation through the University of Minnesota MRSEC under Award Number DMR-2011401; National Science Foundation under Grant No. DMR-1654318; the Army Research Office (W911NF-14-1-0247) under the MURI program; NSF through the UMN MRSEC program under Award Number DMR-2011401; Louise T. Dosdall Fellowship
Date made availableNov 10 2021
PublisherData Repository for the University of Minnesota
Date of data productionMay 23 2019 - Jun 21 2021

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