Data supporting Holey Substrate-Directed Strain Pattering in Bilayer MoS2

Abstract
This data set contains transmission electron microscopy (TEM), atomic force microscopy (AFM), and atomistic simulation data supporting "Holey Substrate-Directed Strain Pattering in Bilayer MoS2" manuscript cited in referenced by.

Description
All TEM images are in .dm3 or .tif file formats, which can be accessed by Gatan DigitalMicrograph software. The AFM data showing topographic mapping were provided in .gwy and .txt file formats. Detailed description of the simulation data is provided in a readme file.

Funding information
Sponsorship: National Science Foundation through the University of Minnesota MRSEC under Award Number DMR-2011401; National Science Foundation under Grant No. DMR-1654318; the Army Research Office (W911NF-14-1-0247) under the MURI program; NSF through the UMN MRSEC program under Award Number DMR-2011401; Louise T. Dosdall Fellowship